𝔖 Bobbio Scriptorium
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Impact of silicon nitride CESL on NLDEMOS transistor reliability

✍ Scribed by Beylier, G.; Bruyère, S.; Benoit, D.; Ghibaudo, G.


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
745 KB
Volume
48
Category
Article
ISSN
0026-2714

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