✦ LIBER ✦
Comparative reliability tests on silicon-planar-switching transistors of european and U.S. manufacture
✍ Scribed by G. Guekos; M.J.O. Strutt
- Publisher
- Elsevier Science
- Year
- 1967
- Tongue
- English
- Weight
- 902 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0026-2714
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