Impact of anomalous short-channel MOS transistors on VLSI circuit reliability

✍ Scribed by George L. Schnable; Kenneth M. Schlesier; George A. Swartz; Chung P. Wu

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 856 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90325-s