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Impact of Interfacial Trap Density of States on the Stability of Amorphous InGaZnO-Based Thin-Film Transistors

✍ Scribed by Huang, Xiao-Ming; Wu, Chen-Fei; Lu, Hai; Xu, Qing-Yu; Zhang, Rong; Zheng, You-Dou

No coin nor oath required. For personal study only.

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