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Modeling of amorphous InGaZnO thin film transistors using an empirical mobility function based on the exponential deep and tail states

✍ Scribed by Jae-Heon Shin; Woo-Seok Cheong; Chi-Sun Hwang; Sung Mook Chung


Book ID
113937135
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
241 KB
Volume
520
Category
Article
ISSN
0040-6090

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