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Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

✍ Scribed by Minkyung Bae; Daeyoun Yun; Yongsik Kim; Dongsik Kong; Hyun Kwang Jeong; Woojoon Kim; Jaehyeong Kim; Inseok Hur; Dae Hwan Kim; Dong Myong Kim

Book ID: 119799713
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 306 KB
Volume: 33
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2011.2182602

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