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Modified Conductance Method for Extraction of Subgap Density of States in a-IGZO Thin-Film Transistors

โœ Scribed by Bae, H.; Jun, S.; Jo, C. H.; Choi, H.; Lee, J.; Kim, Y. H.; Hwang, S.; Jeong, H. K.; Hur, I.; Kim, W.; Yun, D.; Hong, E.; Seo, H.; Kim, D. H.; Kim, D. M.


Book ID
119799744
Publisher
IEEE
Year
2012
Tongue
English
Weight
523 KB
Volume
33
Category
Article
ISSN
0741-3106

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