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Impact of interface impurities on heterostructure field-effect transistors

✍ Scribed by Reynolds, C.L., Jr.; Vuong, H.H.T.; Peticolas, L.J.

Book ID: 114534857
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 599 KB
Volume: 39
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.163458

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