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Impact of gate induced drain leakage on overall leakage of submicrometer CMOS VLSI circuits

โœ Scribed by Semenov, O.; Pradzynski, A.; Sachdev, M.


Book ID
111860989
Publisher
IEEE
Year
2002
Tongue
English
Weight
509 KB
Volume
15
Category
Article
ISSN
0894-6507

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