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Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs

โœ Scribed by Pailloncy, G.; Raynaud, C.; Vanmackelberg, M.; Danneville, F.; Lepilliet, S.; Raskin, J.-P.; Dambrine, G.


Book ID
114617560
Publisher
IEEE
Year
2004
Tongue
English
Weight
726 KB
Volume
51
Category
Article
ISSN
0018-9383

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