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Physical Model of Noise Mechanisms in SOI and Bulk-Silicon MOSFETs for RF Applications

โœ Scribed by Adan, A.O.; Koyanagi, M.; Fukumi, M.


Book ID
114619134
Publisher
IEEE
Year
2008
Tongue
English
Weight
791 KB
Volume
55
Category
Article
ISSN
0018-9383

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