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A new model for thermal channel noise of deep-submicron MOSFETs and its application in RF-CMOS design

✍ Scribed by Knoblinger, G.; Klein, P.; Tiebout, H.

Book ID: 119775858
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 336 KB
Volume: 36
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.918922

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