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[IEEE 2011 12th International Conference on Ultimate Integration on Silicon (ULIS) - Cork, Ireland (2011.03.14-2011.03.16)] Ulis 2011 Ultimate Integration on Silicon - Statistical comparison of random telegraph noise (RTN) in bulk and fully depleted SOI MOSFETs

✍ Scribed by Nishimura, Jun; Saraya, Takuya; Hiramoto, Toshiro

No coin nor oath required. For personal study only.

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