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High-Frequency and Noise Performances of 65-nm MOSFET at Liquid Nitrogen Temperature

✍ Scribed by Siligaris, A.; Pailloncy, G.; Delcourt, S.; Valentin, R.; Lepilliet, S.; Danneville, F.; Gloria, D.; Dambrine, G.


Book ID
114618350
Publisher
IEEE
Year
2006
Tongue
English
Weight
456 KB
Volume
53
Category
Article
ISSN
0018-9383

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