Impact of Donor Concentration, Electric Field, and Temperature Effects on the Leakage Current in Germanium p n Junctions

✍ Scribed by Eneman, G.; Wiot, M.; Brugere, A.; Casain, O.S.I.; Sonde, S.; Brunco, D.P.; De Jaeger, B.; Satta, A.; Hellings, G.; De Meyer, K.; Claeys, C.; Meuris, M.; Heyns, M.M.; Simoen, E.

• Book ID: 114619518
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 539 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.927660