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On the Temperature and Field Dependence of Trap-Assisted Tunneling Current in Ge $\hbox{p}^{+}\hbox{n}$ Junctions

✍ Scribed by E. Simoen; F. De Stefano; G. Eneman; B. De Jaeger; C. Claeys; F. Crupi


Book ID
124162055
Publisher
IEEE
Year
2009
Tongue
English
Weight
170 KB
Volume
30
Category
Article
ISSN
0741-3106

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