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Impact of distributed gate resistance on the performance of MOS devices

✍ Scribed by Razavi, B.; Ran-Hong Yan; Lee, K.F.

Book ID: 115462683
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 447 KB
Volume: 41
Category: Article
ISSN: 1057-7122
DOI: 10.1109/81.331530

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