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Imaging of photorefractive effects in LiNbO3 by double crystal X-ray reflection topography

✍ Scribed by Strocka, B.


Publisher
John Wiley and Sons
Year
1978
Tongue
English
Weight
268 KB
Volume
45
Category
Article
ISSN
0031-8965

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## Abstract SiC crystals of high structural perfection were investigated with several methods of X‐ray diffraction topography in Bragg‐case geometry. The methods included section and projection synchrotron white beam topography and monochromatic beam topography. The investigated 6H and 4H samples c