✦ LIBER ✦
Characterization of silicon on insulator substrates using reflection mode double-crystal X-ray topography
✍ Scribed by David I. Ma; George J. Campisi; Syed B. Qadri; Martin C. Peckerar
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 887 KB
- Volume
- 206
- Category
- Article
- ISSN
- 0040-6090
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