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[IEEE Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2007.03.18-2007.03.22)] Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - EHD Enhanced Heat Transfer with Needle-Arrayed Electrodes

✍ Scribed by Li, H. Y.; Huang, R. T.; Sheu, W. J.; Wang, C. C.

Book ID: 125929299
Publisher: IEEE
Year: 2007
Weight: 394 KB
Category: Article
ISBN-13: 9781424409587
DOI: 10.1109/STHERM.2007.352415

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