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[IEEE Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2007.03.18-2007.03.22)] Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Performance Characteristics of Vapor Chambers with Boiling Enhanced Multi-Wick Structures

✍ Scribed by Lee, S.H.-K.; Chu, S. K.; Choi, C. C. C.; Jaluria, Y.

Book ID: 125465050
Publisher: IEEE
Year: 2007
Weight: 424 KB
Category: Article
ISBN-13: 9781424409587
DOI: 10.1109/stherm.2007.352411

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