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[IEEE Twenty Seventh Annual IEEE/CPMT/SEMI International Electronics Manufacturing Technology Symposium - San Jose, CA, USA (17-18 July 2002)] 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium - Ball shear versus ball pull test methods for evaluating interfacial failures in area array packages

✍ Scribed by Coyle, R.J.; Serafino, A.J.; Solan, P.P.

Book ID: 126698493
Publisher: IEEE
Year: 2002
Weight: 573 KB
Category: Article
ISBN-13: 9780780373013
DOI: 10.1109/IEMT.2002.1032754

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