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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - New correlations between electrical current and temperature rise in PCB traces

✍ Scribed by Adam, J.

Book ID: 126992544
Publisher: IEEE
Year: 2004
Weight: 565 KB
Category: Article
ISBN-13: 9780780383630
DOI: 10.1109/stherm.2004.1291337

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