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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Hierarchical thermal modeling for SOI technology

✍ Scribed by Xiu, K.; Ketchen, M.

Book ID: 125433092
Publisher: IEEE
Year: 2004
Weight: 589 KB
Category: Article
ISBN-13: 9780780383630
DOI: 10.1109/stherm.2004.1291294

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