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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - New technology for thermoelectric cooling

✍ Scribed by Bass, J.C.; Allen, D.T.; Ghamaty, S.; Elsner, N.B.

Book ID: 126766869
Publisher: IEEE
Year: 2004
Weight: 616 KB
Category: Article
ISBN-13: 9780780383630
DOI: 10.1109/STHERM.2004.1291295

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