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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Electric and thermal transient effects in high power optical devices

✍ Scribed by Farkas, G.; Haque, S.; Wall, F.; Martin, P.S.; Poppe, A.; van Voorst Vader, Q.; Bognar, G.

Book ID: 126956593
Publisher: IEEE
Year: 2004
Weight: 486 KB
Category: Article
ISBN-13: 9780780383630
DOI: 10.1109/stherm.2004.1291320

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