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[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Thermal analysis of circuit boards and microelectronic components using an analytical solution to the heat conduction equation

✍ Scribed by Ellison, G.N.

Book ID: 126599960
Publisher: IEEE
Year: 1996
Weight: 526 KB
Category: Article
ISBN-13: 9780780331396
DOI: 10.1109/STHERM.1996.545104

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