𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Thermal reliability of power insulated gate bipolar transistor (IGBT) modules

✍ Scribed by Wuchen Wu, ; Guo Gao, ; Limin Dong, ; Zhengyuan Wang, ; Held, M.; Jacob, P.; Scacco, P.

Book ID: 121870664
Publisher: IEEE
Year: 1996
Weight: 511 KB
Category: Article
ISBN-13: 9780780331396
DOI: 10.1109/STHERM.1996.545103

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Twelfth Annual IEEE Semiconductor

[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Experimental determination of thermal conductivity of printed wiring boards

✍ Azar, K.; Graebner, J.E. 📂 Article 📅 1996 🏛 IEEE ⚖ 699 KB

[IEEE Twelfth Annual IEEE Semiconductor

[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Design and optimization of pin fin heat sinks for low velocity applications

✍ Shaukatullah, H.; Storr, W.R.; Hansen, B.J.; Gaynes, M.A. 📂 Article 📅 1996 🏛 IEEE ⚖ 891 KB

[IEEE Twelfth Annual IEEE Semiconductor

[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Thermal analysis of circuit boards and microelectronic components using an analytical solution to the heat conduction equation

✍ Ellison, G.N. 📂 Article 📅 1996 🏛 IEEE ⚖ 526 KB

[IEEE Twenty-Second Annual IEEE Semicond

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Thermal management of high power memory module

✍ Heejin Lee, ; Haehyung Lee, ; Joonghyun Baek, ; Taegyeong Chung, ; Seyong Oh, 📂 Article 📅 2006 🏛 IEEE ⚖ 448 KB

[IEEE Thirteenth Annual IEEE. Semiconduc

[IEEE Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Austin, TX, USA (28-30 Jan. 1997)] Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Thermal testing methods to increase system reliability

✍ Szekely, V.; Rencz, M.; Courtois, B. 📂 Article 📅 1997 🏛 IEEE ⚖ 843 KB

[IEEE [1992 Proceedings] Eighth Annual I

[IEEE [1992 Proceedings] Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Austin, TX, USA (3-5 Feb. 1992)] [1992 Proceedings] Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Determination of appropriate thermal transport properties for electronics applications

✍ Tye, R.P.; Maesono, A. 📂 Article 📅 1992 🏛 IEEE ⚖ 392 KB