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[IEEE Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Austin, TX, USA (28-30 Jan. 1997)] Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Thermal testing methods to increase system reliability

✍ Scribed by Szekely, V.; Rencz, M.; Courtois, B.

Book ID: 126599211
Publisher: IEEE
Year: 1997
Weight: 843 KB
Category: Article
ISBN-13: 9780780337930
DOI: 10.1109/STHERM.1997.566798

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