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[IEEE Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Austin, TX, USA (28-30 Jan. 1997)] Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Evaluation of isothermal and isoflux natural convection coefficient correlations for utilization in electronic package level thermal analysis

✍ Scribed by Zahn, B.A.; Stout, R.P.

Book ID: 111859020
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 740 KB
Volume: 0
Category: Article
ISBN-13: 9780780337930
DOI: 10.1109/stherm.1997.566779

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