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[IEEE Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Austin, TX, USA (28-30 Jan. 1997)] Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium - Characterization of longitudinal fin heat sink thermal performance and flow bypass effects through CFD methods

✍ Scribed by Barrett, A.V.; Obinelo, I.F.

Book ID: 118026896
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 569 KB
Volume: 0
Category: Article
ISBN-13: 9780780337930
DOI: 10.1109/stherm.1997.566793

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