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[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Design and optimization of pin fin heat sinks for low velocity applications

✍ Scribed by Shaukatullah, H.; Storr, W.R.; Hansen, B.J.; Gaynes, M.A.

Book ID: 118022579
Publisher: IEEE
Year: 1996
Weight: 891 KB
Volume: 0
Category: Article
ISBN-13: 9780780331396
DOI: 10.1109/stherm.1996.545105

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