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[IEEE Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2000 - San Jose, CA, USA (21-23 March 2000)] Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.00CH37068) - Pin-fin heat sink modeling and characterization

✍ Scribed by Jung, H.H.; Maveety, J.G.

Book ID: 120271061
Publisher: IEEE
Year: 2000
Weight: 535 KB
Edition: 2000, 16th Annual ed.
Category: Article
ISBN-13: 9780780359161
DOI: 10.1109/STHERM.2000.837092

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