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[IEEE Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2000 - San Jose, CA, USA (21-23 March 2000)] Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.00CH37068) - Thermal RC-network approach to analyze multichip power packages

โœ Scribed by Hauck, T.; Bohm, T.


Book ID
126683652
Publisher
IEEE
Year
2000
Weight
600 KB
Category
Article
ISBN-13
9780780359161

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