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[IEEE Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2000 - San Jose, CA, USA (21-23 March 2000)] Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.00CH37068) - Thermal testing methods for evaluating thin thermally conductive materials

✍ Scribed by Vogdes, C.; Oseguera, F.

Book ID: 126737776
Publisher: IEEE
Year: 2000
Weight: 475 KB
Category: Article
ISBN-13: 9780780359161
DOI: 10.1109/STHERM.2000.837083

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