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[IEEE [1993] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Austin, TX, USA (2-4 Feb. 1993)] [1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Experimental characterization of board conduction sheets

✍ Scribed by Manno, V.P.; Kurita, N.R.; Azar, K.

Book ID: 126697087
Publisher: IEEE
Year: 1993
Weight: 818 KB
Category: Article
ISBN-13: 9780780308633
DOI: 10.1109/STHERM.1993.225322

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