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[IEEE Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2000 - San Jose, CA, USA (21-23 March 2000)] Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.00CH37068) - Thermal analysis of an electronics enclosure: coupling flow network modeling (FNM) and computational fluid dynamics (CFD)

✍ Scribed by Kowalski, T.; Radmehr, A.

Book ID: 118215281
Publisher: IEEE
Year: 2000
Weight: 776 KB
Edition: 2000, 16th Annual ed.
Volume: 0
Category: Article
ISBN-13: 9780780359161
DOI: 10.1109/stherm.2000.837062

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