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✦ LIBER ✦

[IEEE Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (20-22 March 2001)] Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189) - Linear models for temperature and power dependence of thermal resistance in Si, InP and GaAs substrate devices

✍ Scribed by Walkey, D.J.; Smy, T.J.; MacElwee, T.; Maliepaard, M.

Book ID: 126663070
Publisher: IEEE
Year: 2001
Weight: 416 KB
Category: Article
ISBN-13: 9780780366497
DOI: 10.1109/STHERM.2001.915183

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