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[IEEE Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (20-22 March 2001)] Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189) - A generic method for thermal multiport model generation of IC packages

✍ Scribed by Rencz, M.; Szekely, V.

Book ID: 126721039
Publisher: IEEE
Year: 2001
Weight: 812 KB
Category: Article
ISBN-13: 9780780366497
DOI: 10.1109/STHERM.2001.915164

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