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[IEEE Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (20-22 March 2001)] Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189) - Optimization of thermal resistance in quasi monolithic integration technology (QMIT) structure

✍ Scribed by Joodaki, M.; Kompa, G.; Hillmer, H.; Kassing, R.

Book ID: 126604466
Publisher: IEEE
Year: 2001
Weight: 634 KB
Category: Article
ISBN-13: 9780780366497
DOI: 10.1109/STHERM.2001.915136

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