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[IEEE Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (20-22 March 2001)] Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189) - Temperature sensors placement strategy for fault diagnosis in integrated circuits

✍ Scribed by Bratek, P.; Kos, A.

Book ID: 120814447
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 608 KB
Category: Article
ISBN-13: 9780780366497
DOI: 10.1109/STHERM.2001.915185

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