𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - San Jose, CA, USA (March 15-17, 2005)] Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - In-situ thickness method of measuring thermo-physical properties of polymer-like thermal interface materials

✍ Scribed by Smith, R.A.; Culham, R.J.

Book ID: 126736039
Publisher: IEEE
Year: 2005
Weight: 933 KB
Category: Article
ISBN-13: 9780780389854
DOI: 10.1109/STHERM.2005.1412159

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