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[IEEE Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - San Jose, CA, USA (March 15-17, 2005)] Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - Temperature mapping of metal interconnects using scanning thermoreflectance microscope

✍ Scribed by Yizhang Yang, ; Asheghi, M.

Book ID: 120581878
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 745 KB
Category: Article
ISBN-13: 9780780389854
DOI: 10.1109/STHERM.2005.1412195

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