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[IEEE Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - San Jose, CA, USA (March 15-17, 2005)] Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - Ultrahigh-thermal-conductivity packaging materials

✍ Scribed by Zweben, C.

Book ID: 126063737
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 578 KB
Category: Article
ISBN-13: 9780780389854
DOI: 10.1109/STHERM.2005.1412174

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