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[IEEE Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - San Jose, CA, USA (March 15-17, 2005)] Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - Thermal metrology of silicon microstructures using raman spectroscopy

✍ Scribed by Abel, M.R.; Wright, T.L.; Sunden, E.O.; Graham, S.; King, W.P.; Lance, M.J.

Book ID: 118274197
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 753 KB
Volume: 0
Category: Article
ISBN-13: 9780780389854
DOI: 10.1109/stherm.2005.1412185

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