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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Thermal characterization of a mercury arc lamp for a projection display system

โœ Scribed by Bush, B.; Shu Li, ; Kelley, D.


Book ID
111690001
Publisher
IEEE
Year
2004
Weight
839 KB
Volume
0
Category
Article
ISBN-13
9780780383630

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