𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Electrical characterization of partially insulated MOSFETs with buried insulators under source/drain regions

✍ Scribed by Chang Woo Oh, ; Kyoung Hwan Yeo, ; Min Sang Kim, ; Chang-Sub Lee, ; Dong Uk Choi, ; Sung Hwan Kim, ; Sung-Young Lee, ; Sung-Min Kim, ; Jung-Dong Choe, ; Yong Kyu Lee, ; Eun-Jung Yoon, ; Ming Li, ; Sung Dae Suk, ; Dong-Won Kim, ; Donggun Park, ; Kinam Kim,

Book ID: 126657466
Publisher: IEEE
Year: 2004
Weight: 280 KB
Category: Article
ISBN-13: 9780780384781
DOI: 10.1109/ESSDER.2004.1356532

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Electrical characterization and modelling of high-performance SON DG MOSFETs

✍ Harrison, S.; Munteanu, D.; Autran, U.; Cros, A.; Cerutti, R.; Skotnicki, T. 📂 Article 📅 2004 🏛 IEEE ⚖ 294 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Perspective of FinFETs for analog applications

✍ Kilchytska, V.; Collaert, N.; Rooyackers, R.; Lederer, D.; Raskin, J.-P.; Flandr 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 286 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - New methodologies of NBTI characterization eliminating recovery effects

✍ Denais, M.; Huard, V.; Parthasarathy, C.; Ribes, G.; Perrier, F.; Revil, N.; Bra 📂 Article 📅 2004 🏛 IEEE ⚖ 278 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - FinFET SRAM for high-performance low-power applications

✍ Joshi, R.V.; Williams, R.Q.; Nowak, E.; Kim, K.; Beintner, J.; Ludwig, T.; Aller 📂 Article 📅 2004 🏛 IEEE ⚖ 297 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Interface passivation mechanisms in metal gated oxide capacitors

✍ Lujan, G.S.; Schram, T.; Sjoblom, G.; Witters, T.; Kubicek, S.; De Gendt, S.; He 📂 Article 📅 2004 🏛 IEEE ⚖ 235 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Gate-capacitance extraction from RF C-V measurements [MOS device applications]

✍ Sasse, G.T.; de Kort, R.; Schmitz, J. 📂 Article 📅 2004 🏛 IEEE ⚖ 273 KB