𝔖 Bobbio Scriptorium

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[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1989.12.3-1989.12.6)] International Technical Digest on Electron Devices Meeting - Molecular-dynamics study of single-electron phenomena - impact of charge quantization on 1-100 nm Si-MOSFETs

✍ Scribed by Yano, ; Ferry, ; Seki,

Book ID: 120650782
Publisher: IEEE
Year: 1992
Weight: 343 KB
Category: Article
ISBN-13: 9780780308176
DOI: 10.1109/IEDM.1992.307423

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