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[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1989.12.3-1989.12.6)] International Technical Digest on Electron Devices Meeting - Universal description of hot-carrier-induced interface states in NMOSFETs

✍ Scribed by Woltjer, ; Paulzen,

Book ID: 124091859
Publisher: IEEE
Year: 1992
Weight: 339 KB
Category: Article
ISBN-13: 9780780308176
DOI: 10.1109/IEDM.1992.307418

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