𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1989.12.3-1989.12.6)] International Technical Digest on Electron Devices Meeting - Self-consistent simulation of hot-carrier damage enhanced gate induced drain leakage

✍ Scribed by Schwerin, ; Bergner, ; Jacobs,

Book ID: 120220557
Publisher: IEEE
Year: 1992
Weight: 310 KB
Category: Article
ISBN-13: 9780780308176
DOI: 10.1109/IEDM.1992.307420

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